| Radiative heat transfer in the extreme near field K Kim, B Song, V Fernández-Hurtado, W Lee, W Jeong, L Cui, ... Nature 528 (7582), 387-391, 2015 | 311 | 2015 |
| Heat dissipation in atomic-scale junctions W Lee, K Kim, W Jeong, LA Zotti, F Pauly, JC Cuevas, P Reddy Nature 498 (7453), 209-212, 2013 | 231 | 2013 |
| Electrostatic control of thermoelectricity in molecular junctions Y Kim, W Jeong, K Kim, W Lee, P Reddy Nature nanotechnology 9 (11), 881-885, 2014 | 188 | 2014 |
| Ultra-High Vacuum Scanning Thermal Microscopy for Nanometer Resolution Quantitative Thermometry K Kim, W Jeong, W Lee, P Reddy ACS nano, 2012 | 185 | 2012 |
| Quantitative measurement with scanning thermal microscope by preventing the distortion due to the heat transfer through the air K Kim, J Chung, G Hwang, O Kwon, JS Lee Acs Nano 5 (11), 8700-8709, 2011 | 124 | 2011 |
| Heat dissipation and its relation to thermopower in single-molecule junctions LA Zotti, M Bürkle, F Pauly, W Lee, K Kim, W Jeong, Y Asai, P Reddy, ... New Journal of Physics 16 (1), 015004, 2014 | 88 | 2014 |
| Quantitative scanning thermal microscopy using double scan technique K Kim, J Chung, J Won, O Kwon, JS Lee, SH Park, YK Choi Applied Physics Letters 93, 203115, 2008 | 88* | 2008 |
| Characterization of nanoscale temperature fields during electromigration of nanowires W Jeong, K Kim, Y Kim, W Lee, P Reddy Scientific reports 4 (1), 1-6, 2014 | 54 | 2014 |
| Quantitative temperature profiling through null-point scanning thermal microscopy J Chung, KT Kim, G Hwang, O Kwon, YK Choi, JS Lee International Journal of Thermal Sciences, 2011 | 48 | 2011 |
| Novel nanoscale thermal property imaging technique: the 2ω method. I. principle and the 2ω signal measurement HH Roh, JS Lee, DL Kim, J Park, K Kim, O Kwon, SH Park, YK Choi, ... Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2006 | 46 | 2006 |
| Quantitative temperature measurement of an electrically heated carbon nanotube using the null-point method J Chung, K Kim, G Hwang, O Kwon, S Jung, J Lee, JW Lee, GT Kim Review of Scientific Instruments 81, 114901, 2010 | 44 | 2010 |
| Novel nanoscale thermal property imaging technique: the 2ω method. II. demonstration and comparison HH Roh, JS Lee, DL Kim, J Park, K Kim, O Kwon, SH Park, YK Choi, ... Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2006 | 33 | 2006 |
| Quantification of thermal and contact resistances of scanning thermal probes K Kim, W Jeong, W Lee, S Sadat, D Thompson, E Meyhofer, P Reddy Applied Physics Letters 105 (20), 203107, 2014 | 32 | 2014 |
| A platform to parallelize planar surfaces and control their spatial separation with nanometer resolution Y Ganjeh, B Song, K Pagadala, K Kim, S Sadat, W Jeong, K Kurabayashi, ... Review of Scientific Instruments 83 (10), 105101-105101-9, 2012 | 26 | 2012 |
| Quantitative Thermopower Profiling across a Silicon pn Junction with Nanometer Resolution B Lee, K Kim, S Lee, JH Kim, DS Lim, O Kwon, JS Lee Nano Letters, 2012 | 15 | 2012 |
| Nanoscale range finding of subsurface structures by measuring the absolute phase lag of thermal wave J Chung, K Kim, G Hwang, O Kwon, JS Lee, SH Park, YK Choi Review of Scientific Instruments 81, 053701, 2010 | 11 | 2010 |
| Simultaneous measurement of thermal conductivity and interface thermal conductance of diamond thin film B Lee, JS Lee, SU Kim, K Kim, O Kwon, S Lee, JH Kim, DS Lim Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2009 | 11 | 2009 |
| Thermal conductance in single molecules and self-assembled monolayers: physicochemical insights, progress, and challenges S Park, J Jang, H Kim, DI Park, K Kim, HJ Yoon Journal of Materials Chemistry A 8 (38), 19746-19767, 2020 | 8 | 2020 |
| Thermopower profiling of a silicon pn junction K Kim, J Park, SU Kim, O Kwon, JS Lee, SH Park, YK Choi Applied physics letters 90 (4), 043107-043107-3, 2007 | 8 | 2007 |
| Development of Robust Batch-Fabrication Process for High Performance SThM Probe and Quantitative Performance Evaluation K Hwang, K Kim, J Chung, O Kwon, B Lee, JS Lee, S Park, YK Choi ASME, 2009 | 6* | 2009 |
Pramod ReddyProfessor of Mechanical EngineeringVerified email at umich.edu
