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Co-authors
- Doh C. LeeKorea Advanced Institute of Science and TechnologyVerified email at kaist.edu
- Jun Hyuk ChangUniversity of ChicagoVerified email at uchicago.edu
- Changhee LeeEVP, Display Research Center, Samsung Display Co.Verified email at samsung.com
- Jaehoon LimSungkyunkwan UniversityVerified email at skku.edu
- Donghyo HahmLos Alamos National LaboratoryVerified email at snu.ac.kr
- Kyoungwon ParkKorea Electronics Institute TechnologyVerified email at keti.re.kr
- Seunghyun RheeKOREA RESEARCH INSTITUTE OF CHEMICAL TECHNOLOGY, ADVANCED MATERIALS DIVISIONVerified email at krict.re.kr
- Jinhan ChoKorea UniversityVerified email at korea.ac.kr
- Victor I. KlimovScientist, Los Alamos National LaboratoryVerified email at lanl.gov
- Gabriel NagamineETH ZürichVerified email at ethz.ch
- Lázaro A. PadilhaAssociate Professor, Universidade Estadual de CampinasVerified email at ifi.unicamp.br
- Young-Shin ParkLos Alamos National LaboratoryVerified email at lanl.gov
- Heeyoung JungNanosysVerified email at nanosys-shoei.com
- E. H. HwangSungKyunKwan UniversityVerified email at skku.edu
- Jeongkyun RohPusan National UniversityVerified email at pusan.ac.kr
- Whi Dong KimKorea Institute of Industrial TechnologyVerified email at kitech.re.kr
- Jeong Woo ParkSKKUVerified email at skku.edu
- Hyung-Jun SongSeoul National University of Science and TechnologyVerified email at seoultech.ac.kr
- Jeffrey M. PietrygaProgram Manager, National Security Education Center, Los Alamos National LaboratoryVerified email at lanl.gov
- Hak June LeeSungkyunkwan UniversityVerified email at skku.edu