| Electrically programmable fuse (eFUSE) using electromigration in silicides C Kothandaraman, SK Iyer, SS Iyer IEEE Electron Device Letters 23 (9), 523-525, 2002 | 273 | 2002 |
| Electrically programmable fuse (efuse): From memory redundancy to autonomic chips N Robson, J Safran, C Kothandaraman, A Cestero, X Chen, ... 2007 IEEE Custom Integrated Circuits Conference, 799-804, 2007 | 189 | 2007 |
| 3D copper TSV integration, testing and reliability MG Farooq, TL Graves-Abe, WF Landers, C Kothandaraman, BA Himmel, ... 2011 international electron devices meeting, 7.1. 1-7.1. 4, 2011 | 135 | 2011 |
| A cost effective 32nm high-K/metal gate CMOS technology for low power applications with single-metal/gate-first process X Chen, S Samavedam, V Narayanan, K Stein, C Hobbs, C Baiocco, W Li, ... 2008 Symposium on VLSI Technology, 88-89, 2008 | 130 | 2008 |
| A compact eFuse programmable array memory for SOI CMOS J Safran, A Leslie, G Fredeman, C Kothandaraman, A Cestero, X Chen, ... 2007 IEEE Symposium on VLSI Circuits, 72-73, 2007 | 117 | 2007 |
| A commercial field-programmable dense eFUSE array memory with 99.999% sense yield for 45nm SOI CMOS G Uhlmann, T Aipperspach, T Kirihata, C Kothandaraman, YZ Li, C Paone, ... 2008 IEEE International Solid-State Circuits Conference-Digest of Technical …, 2008 | 110 | 2008 |
| System for programming fuse structure by electromigration of silicide enhanced by creating temperature gradient C Kothandaraman, SSK Iyer, S Iyer, C Narayan US Patent 6,624,499, 2003 | 108 | 2003 |
| Reliability qualification of CoSi2 electrical fuse for 90nm technology C Tian, B Park, C Kothandaraman, J Safran, D Kim, N Robson, SS Iyer 2006 IEEE International Reliability Physics Symposium Proceedings, 392-397, 2006 | 104 | 2006 |
| A 0.13 mum Logic-Based Embedded DRAM Technology With Electrical Fuses, Cu Interconnect in SiLK™, Sub-7ns Random Access Time and Its Extention to the 0.10 mum Generation V Klee, J Norum, R Weaver, SSK Iyer, CR Kothandaraman, J Chiou, ... INTERNATIONAL ELECTRON DEVICES MEETING 1 (1), 407-410, 1998 | 91 | 1998 |
| Reprogrammable fuse structure and method GW Burr, C Kothandaraman, CH Lam, XH Liu, SM Rossnagel, CS Tyberg, ... US Patent 7,388,273, 2008 | 89 | 2008 |
| Reliability investigation of NiPtSi electrical fuse with different programming mechanisms CE Tian, D Moy, C Le, B Messenger, C Kothandaraman, J Safran, S Wu, ... IEEE Transactions on Device and Materials Reliability 8 (3), 536-542, 2008 | 80 | 2008 |
| Changing chip function based on fuse states KR Erickson, JA Fifield, C Kothandaraman, PC Paone, WR Tonti US Patent 7,268,577, 2007 | 76 | 2007 |
| Spin-transfer torque MRAM with reliable 2 ns writing for last level cache applications G Hu, JJ Nowak, MG Gottwald, SL Brown, B Doris, CP D’Emic, P Hashemi, ... 2019 IEEE International Electron Devices Meeting (IEDM), 2.6. 1-2.6. 4, 2019 | 51 | 2019 |
| Programmable fuse/non-volatile memory structures in BEOL regions using externally heated phase change material KN Chen, BG Elmegreen, D Kim, C Kothandaraman, L Krusin-Elbaum, ... US Patent 7,633,079, 2009 | 50 | 2009 |
| Enhanced efuses by the local degradation of the fuse link C Kothandaraman, F Grellner, SK Iyer US Patent 6,368,902, 2002 | 47 | 2002 |
| The Impact of Self-Heating on Charge Trapping in High--Metal-Gate nFETs F Khan, E Cartier, C Kothandaraman, JC Scott, JCS Woo, SS Iyer IEEE Electron Device Letters 37 (1), 88-91, 2015 | 44 | 2015 |
| Antifuse structure having an integrated heating element B Park, SS Iyer, C Kothandaraman US Patent 7,323,761, 2008 | 44 | 2008 |
| Using electrically programmable fuses to hide architecture, prevent reverse engineering, and make a device inoperable AR Bonaccio, KR Erickson, JA Fifield, C Kothandaraman, PC Paone, ... US Patent 7,442,583, 2008 | 43 | 2008 |
| Physically unclonable fuse using a NOR type memory array SS Iyer, T Kirihata, C Kothandaraman, DH Leu, S Rosenblatt US Patent 9,436,845, 2016 | 41 | 2016 |
| Modified donor–acceptor pair luminescence in heavily nitrogen‐doped zinc selenide C Kothandaraman, GF Neumark, RM Park Applied physics letters 67 (22), 3307-3309, 1995 | 39 | 1995 |
SUBRAMANIAN S. IYERUniversity of California at Los Angeles,Verified email at g.ucla.edu
