Heiko Reith
Heiko Reith
Leibniz Institute for Solid State and Materials Research
Verified email at
Cited by
Cited by
The experimental investigation of thermal conductivity and the Wiedemann–Franz law for single metallic nanowires
F Völklein, H Reith, TW Cornelius, M Rauber, R Neumann
Nanotechnology 20 (32), 325706, 2009
Improved thermoelectric performance of n-type half-Heusler MCo1-xNixSb (M= Hf, Zr)
R He, H Zhu, J Sun, J Mao, H Reith, S Chen, G Schierning, K Nielsch, ...
Materials Today Physics 1, 24-30, 2017
A tunable strain sensor using nanogranular metals
CH Schwalb, C Grimm, M Baranowski, R Sachser, F Porrati, H Reith, ...
Sensors 10 (11), 9847-9856, 2010
Synergetic Enhancement of Thermoelectric Performance by Selective Charge Anderson Localization–Delocalization Transition in n-Type Bi-Doped PbTe/Ag2Te …
MH Lee, JH Yun, G Kim, JE Lee, SD Park, H Reith, G Schierning, ...
ACS nano 13 (4), 3806-3815, 2019
Measuring methods for the investigation of in‐plane and cross‐plane thermal conductivity of thin films
F Völklein, H Reith, A Meier
physica status solidi (a) 210 (1), 106-118, 2013
Integrated microthermoelectric coolers with rapid response time and high device reliability
G Li, J Garcia Fernandez, DA Lara Ramos, V Barati, N Pérez, I Soldatov, ...
Nature Electronics 1 (10), 555-561, 2018
Advanced platform for the in-plane ZT measurement of thin films
V Linseis, F Völklein, H Reith, K Nielsch, P Woias
Review of Scientific Instruments 89 (1), 015110, 2018
Towards tellurium-free thermoelectric modules for power generation from low-grade heat
P Ying, R He, J Mao, Q Zhang, H Reith, J Sui, Z Ren, K Nielsch, ...
Nature communications 12 (1), 1-6, 2021
Catalytic purification of directly written nanostructured Pt microelectrodes
R Sachser, H Reith, D Huzel, M Winhold, M Huth
ACS applied materials & interfaces 6 (18), 15868-15874, 2014
Berry phase and band structure analysis of the Weyl semimetal NbP
P Sergelius, J Gooth, S Bäßler, R Zierold, C Wiegand, A Niemann, ...
Scientific reports 6 (1), 1-6, 2016
Platform for in-plane ZT measurement and Hall coefficient determination of thin films in a temperature range from 120 K up to 450 K
V Linseis, F Völklein, H Reith, P Woias, K Nielsch
Journal of Materials Research 31 (20), 3196-3204, 2016
Microchips for the investigation of thermal and electrical properties of individual nanowires
F Völklein, H Reith, MC Schmitt, M Huth, M Rauber, R Neumann
Journal of electronic materials 39 (9), 1950-1956, 2010
The surface-to-volume ratio: A key parameter in the thermoelectric transport of topological insulator Bi 2 Se 3 nanowires
HS Shin, B Hamdou, H Reith, H Osterhage, J Gooth, C Damm, ...
Nanoscale 8 (28), 13552-13557, 2016
Doping High‐Mobility Donor–Acceptor Copolymer Semiconductors with an Organic Salt for High‐Performance Thermoelectric Materials
J Guo, G Li, H Reith, L Jiang, M Wang, Y Li, X Wang, Z Zeng, H Zhao, ...
Advanced Electronic Materials 6 (3), 1900945, 2020
Intra-wire coupling in segmented Ni/Cu nanowires deposited by electrodeposition
P Sergelius, JH Lee, O Fruchart, MS Salem, S Allende, RA Escobar, ...
Nanotechnology 28 (6), 065709, 2017
Fabrication and thermoelectrical characterization of three‐dimensional nanowire networks
MFP Wagner, F Völklein, H Reith, C Trautmann, ME Toimil‐Molares
physica status solidi (a) 213 (3), 610-619, 2016
Complete thermoelectric characterization of PEDOT: PSS thin films with a novel ZT test chip platform
V Linseis, ZM Hassan, H Reith, J Garcia, K Nielsch, H Baumgart, E Redel, ...
physica status solidi (a) 215 (7), 1700930, 2018
Electronic structure and thermoelectric properties of transition metal monosilicides
DA Pshenay-Severin, YV Ivanov, AT Burkov, SV Novikov, VK Zaitsev, ...
Journal of Electronic Materials 47 (6), 3277-3281, 2018
Fabrication and modeling of integrated micro-thermoelectric cooler by template-assisted electrochemical deposition
J Garcia, DAL Ramos, M Mohn, H Schlörb, NP Rodriguez, L Akinsinde, ...
ECS Journal of Solid State Science and Technology 6 (3), N3022, 2017
Transport properties of cobalt monosilicide and its alloys at low temperatures
AT Burkov, SV Novikov, VK Zaitsev, H Reith
Semiconductors 51 (6), 689-691, 2017
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