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Dileep Agnihotri, Dileep K. Agnihotri, D.K. Agnihotri, D. Agnihotri, DK Agnihotri
Dileep Agnihotri, Dileep K. Agnihotri, D.K. Agnihotri, D. Agnihotri, DK Agnihotri
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Year
Isospin dependence of intermediate mass fragment production in heavy-ion collisions at E/A=55 MeV
JF Dempsey, RJ Charity, LG Sobotka, GJ Kunde, S Gaff, CK Gelbke, ...
Physical Review C 54 (4), 1710, 1996
2081996
Fouling-resistant membranes for the treatment of flowback water from hydraulic shale fracturing: A pilot study
DJ Miller, X Huang, H Li, S Kasemset, A Lee, D Agnihotri, T Hayes, ...
Journal of membrane science 437, 265-275, 2013
1652013
Electrophoretic deposition and reduction of graphene oxide to make graphene film coatings and electrode structures
RS Ruoff, SJ An, M Stoller, T Emilsson, D Agnihotri
US Patent App. 13/052,713, 2011
1172011
Multifragment Production in Reactions of and at
GJ Kunde, SJ Gaff, CK Gelbke, T Glasmacher, MJ Huang, R Lemmon, ...
Physical review letters 77 (14), 2897, 1996
1051996
Reproducibility in X-ray reflectometry: results from the first world-wide round-robin experiment
P Colombi, DK Agnihotri, VE Asadchikov, E Bontempi, DK Bowen, ...
Journal of Applied Crystallography 41 (1), 143-152, 2008
772008
Dynamical fragment production as a mode of energy dissipation in heavy-ion reactions
J Toke, DK Agnihotri, SP Baldwin, B Djerroud, B Lott, BM Quednau, ...
Physical review letters 77 (17), 3514, 1996
631996
Ionic Liquids for Use in Ultracapacitor and Graphene-Based Ultracapacitor
US Patent App. 12/875,880, 2013
47*2013
X-ray measurement of properties of nano-particles
B Yokhin, A Tokar, A Krokhmal, A Peled, D Agnihotri
US Patent 7,680,243, 2010
432010
Role of statistical fluctuations for the interpretation of Arrhenius-type plots in nuclear multifragmentation
J Toke, DK Agnihotri, B Djerroud, W Skulski, WU Schroeder
Physical Review C 56 (4), R1683, 1997
421997
Heavy residues and intermediate-mass fragment production in dissipative collisions at
B Djerroud, DK Agnihotri, SP Baldwin, W Skulski, J Toke, WU Schröder, ...
Physical Review C 64 (3), 034603, 2001
332001
Origin of slow, heavy residues observed in dissipative + collisions at MeV
W Skulski, B Djerroud, DK Agnihotri, SP Baldwin, J Tõke, X Zhao, ...
Physical Review C 53 (6), R2594, 1996
321996
Isospin independence of the H–He double isotope ratio “thermometer”
GJ Kunde, S Gaff, CK Gelbke, T Glasmacher, MJ Huang, R Lemmon, ...
Physics Letters B 416 (1-2), 56-61, 1998
281998
Neutron-proton asymmetry of the midvelocity material in an intermediate-energy heavy-ion collision
LG Sobotka, RJ Charity, DK Agnihotri, W Gawlikowicz, TX Liu, W Lynch, ...
Physical Review C 62 (3), 031603, 2000
242000
Angular momentum induced deformation of 2755Co at 84 MeV excitation
DK Agnihotri, A Kumar, KC Jain, KP Singh, D Kabiraj, DK Avasthi, ...
Physics Letters B 307 (3-4), 283-286, 1993
231993
X-ray reflectometry of thin film layers with enhanced accuracy
D Berman, A Dikopoltsev, D Agnihotri
US Patent 7,062,013, 2006
222006
Material analysis using multiple X-ray reflectometry models
D Agnihotri, A Dikopoltsev, B Yokhin
US Patent 7,103,142, 2006
182006
X-ray reflectometry of thin film layers with enhanced accuracy
D Berman, A Dikopoltsev, D Agnihotri
US Patent 7,130,376, 2006
132006
Correlations between reaction product yields as a tool for probing heavy-ion reaction scenarios
W Gawlikowicz, DK Agnihotri, SA Baldwin, WU Schröder, J Toke, ...
Physical Review C 81 (1), 014604, 2010
122010
Calibration of X-ray reflectometry system
D Berman, A Peled, D Agnihotri, T Rafaeli, B Yokhin
US Patent 7,474,732, 2009
122009
Accurate measurement of layer dimensions using XRF
D Agnihotri, J O'dell, I Mazor, B Yokhin
US Patent 7,804,934, 2010
112010
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